Measurement of electric-field noise from interchangeable samples with a trapped-ion sensor

We demonstrate the use of a single trapped ion as sensor to probe electric-field noise from interchangeable test surfaces. As proof principle, we measure magnitude and distance dependence two ion-trap-like samples with patterned Au electrodes. This trapped-ion could be combined other surface characterization tools help elucidate mechanisms that give rise ion-trap Such presents significant hurdle for performing large-scale quantum computations.